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Taiwan Semiconductor Manufacturing Company

81 Case(s) (Last 5 Years)
www.tsmc.com

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25907
Patents (All Time)
14921
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Patents Prosecuted

Application numberTitle of the patentIPCFiling DateDecision Date
17391311 METHOD OF MANUFACTURING PHOTO MASKS H01L, G03F, G06F Aug 1, 2021
17391271 Methods of Forming Contact Features in Field-Effect Transistors H01L Aug 1, 2021
17391639 MRAM REFERENCE CURRENT H01L, G11C Aug 1, 2021
17391716 MTJ CD Variation By HM Trimming H01F, G11C, H01L Aug 1, 2021
17390124 Replacement Gate Process for Semiconductor Devices H01L Jul 29, 2021
17390833 LITHOGRAPHY SIMULATION METHOD G03F, G06F, G01N Jul 29, 2021
17389774 METHOD OF FORMING MEMORY CELL H01L Jul 29, 2021
17390827 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF H01L, G06F Jul 29, 2021
17390467 TRANSISTOR-BASED PHYSICALLY UNCLONABLE FUNCTION H03K, H04L Jul 29, 2021
17389795 INTEGRATED CIRCUIT WITH GUARD RING H01L Jul 29, 2021
17389819 PROFILE OF DEEP TRENCH ISOLATION STRUCTURE FOR ISOLATION OF HIGH-VOLTAGE DEVICES H01L Jul 29, 2021
17388512 SEMICONDUCTOR INTEGRATED CIRCUIT H01L Jul 28, 2021
17388437 NOVEL LAYOUT TO REDUCE NOISE IN SEMICONDUCTOR DEVICES H01L Jul 28, 2021
17388352 BYPASS STRUCTURE H01L, B81B, B81C Jul 28, 2021
17388394 MAGNETIC TUNNELING JUNCTION (MTJ) ELEMENT WITH AN AMORPHOUS BUFFER LAYER AND ITS FABRICATION PROCESS H01L Jul 28, 2021
17387931 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME H01L Jul 27, 2021
17387525 Dicing Method for Stacked Semiconductor Devices H01L Jul 27, 2021
17387447 Forming a Protective Layer to Prevent Formation of Leakage Paths H01L Jul 27, 2021
17385711 DIELECTRIC CONSTANT REDUCTION OF GATE SPACER H01L Jul 25, 2021
17385264 MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURING METHOD THEREOF G11C, H01L, H01F Jul 25, 2021
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