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Patexia Research
Patent No. US 11309874
Issue Date Apr 19, 2022
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Patent 11309874 - Sequential elements with programmable feedback to program leakage in ASICs > Claims

  • 1. A latched sequential circuit element, comprising: a front end comprising a data input, a clock input (CPP), and a negative clock input (CPN) and configured to have an output connected to an internal node;a first inverter with an input connected to the internal node and an output connected to an output node; andan analog programmable feedback path comprising a second inverter with an input connected to the internal node and an output connected to a feedback node, andan analog-biased inverter with an input connected to the feedback node and an output connected to the internal node;wherein: the analog-biased inverter comprises, in series, a first nMOS transistor, a second nMOS transistor, a first pMOS transistor, and a second pMOS transistor, each transistor having its own respective gate, source, and drain;the gate of the first nMOS transistor is connected to the feedback node, the source of the first nMOS transistor is connected to VSS, and the drain of the first nMOS transistor is connected to the source of the second nMOS transistor;the gate of the second nMOS transistor is held to a first analog bias voltage VBFBN, and the drain of the second nMOS transistor is connected to the internal node;the gate of the first pMOS transistor is held to a second analog bias voltage VBFBP, the drain of the first pMOS transistor is connected to the internal node, and the source of the first pMOS transistor is connected to the drain of the second pMOS transistor; andthe gate of the second pMOS transistor is connected to the feedback node, and the source of the second pMOS transistor is connected to VDD.
    • 2. The latched sequential circuit element of claim 1, wherein the front end is a tri-state front end.
      • 3. The latched sequential circuit element of claim 2, wherein: the tri-state front end comprises, in series, a third nMOS transistor, a fourth nMOS transistor, a third pMOS transistor, and a fourth pMOS transistor, each transistor having its own respective gate, source, and drain;the gate of the third nMOS transistor is connected to the data input, the source of the third nMOS transistor is connected to VSS, and the drain of the third nMOS transistor is connected to the source of the fourth nMOS transistor;the gate of the fourth nMOS transistor is connected to CPP, and the drain of the fourth nMOS transistor is connected to the internal node;the gate of the third pMOS transistor is connected to CPN, the source of the third pMOS transistor is connected to the internal node, and the drain of the third pMOS transistor is connected to the drain of the fourth pMOS transistor; andthe gate of the fourth pMOS transistor is connected to the data input, and the source of the fourth pMOS transistor is connected to VDD.
        • 4. The latched sequential circuit element of claim 3, wherein the first inverter is also the second inverter.
        • 5. The latched sequential circuit element of claim 3, wherein the first inverter is not the second inverter.
    • 6. The latched sequential circuit element of claim 1, wherein: the front end is a pass-gate consisting of a third nMOS transistor and a third pMOS transistor, each of the third nMOS transistor and the third pMOS transistor having its own respective gate, source, and drain;the source of the third nMOS transistor is connected to the source of the third pMOS transistor, and the drain of the third nMOS transistor is connected to the drain of the third pMOS transistor;either the mutually connected sources or the mutually connected drains are connected to the data input, and the mutually connected terminals that are not connected to the data input are connected to the internal node;the gate of the third nMOS transistor is connected to CPP; andthe gate of the third pMOS transistor is connected to CPN.
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