Circuit with interconnect test unit | Patent Number 06807505
US 06807505 B2Filled DateJul 16, 2003
Priority DateJan 29, 1999
Publication DateMar 25, 2004
Expiration DateJan 29, 2019
Inventor/ApplicantsFranciscus G.M. De Jong
Robertus M.W. Raaijmakers
Franciscus G. M. De Jong
Guillaume E.A. Lousberg
Guillaume E. A. Lousberg
Robertus M. W. Raaijmakers
Mathias N.M. Muris
Mathias N. M. Muris
Robertus M.W. Raaijmakers
Franciscus G. M. De Jong
Guillaume E.A. Lousberg
Guillaume E. A. Lousberg
Robertus M. W. Raaijmakers
Mathias N.M. Muris
Mathias N. M. Muris
ExaminesMILLER, CRAIG S
Art Unit2857
Technology Center2800
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