Test structure design for reliability test | Patent Number 07365529
US 07365529 B2Filled DateAug 18, 2006
Priority DateNov 24, 2004
Publication DateJan 18, 2007
Expiration DateApr 29, 2016
Inventor/ApplicantsNaomi Yoshida
Toshiyuki Nagata
Toshiyuki Nagata
ExaminesNGUYEN, TUNG X
Art Unit2829
Technology Center2800
Law Firm
You must be logged in to view
LoginAttorneys
Subscription-Only
View Concierge ProgramEmpower your practice with Patexia Publication Prosecution IP Module.
Get access to our exclusive rankings and unlock powerful data.
Looking for a Publication Attorney?
Get in touch with our team or create your account to start exploring a
network of over 120K attorneys.