High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source | Patent Number 07400704

US 07400704 B1
Application Number11537806
Publication Number-
Pendency1 year, 9 months, 17 days
Filled DateOct 2, 2006
Priority DateJan 14, 2004
Publication Date-
Expiration DateJan 14, 2024
Inventor/ApplicantsDavid R. Trapp
Frederick William Duewer
David Dean Scott
Wenbing Yun
Yuxin Wang
ExaminesKIKNADZE, IRAKLI
Art Unit2882
Technology Center2800
Assignments
Carl Zeiss Xray Microscopy Inc.
Current
Xradia Inc.
Original
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