Method of testing anti-high temperature performance of a magnetic head and apparatus thereof | Patent Number 09121888

US 09121888 B2
Application Number13064994
Publication NumberUS 20120274317 A1
Pendency4 years, 4 months, 6 days
Filled DateApr 29, 2011
Priority DateApr 29, 2011
Publication DateNov 1, 2012
Expiration DateApr 28, 2031
Inventor/ApplicantsCheukwing Leung
Hokei Lam
Chiuming Lueng
Kwokkam Leung
Rongkwang Ni
Cheukman Lui
Juren Ding
Mankit Lee
ExaminesMCANDREW, CHRISTOPHER P
Art Unit2858
Technology Center2800
Assignments
Sae Magnetics H.k. Ltd.
Current
Sae Magnetics H.k. Ltd.
Original
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