Methods of fetal abnormality detection | Patent Publication Number 20150218631

US 20150218631 A1

Patent NumberUS 09493831 B2

Application Number14677854

Filled DateApr 2, 2015

Priority DateJan 23, 2010

Publication DateAug 6, 2015

Original AssigneeIllumina Inc.

Current AssigneeIllumina Inc.

Inventor/ApplicantsYue-Jen Chuu
Richard P. Rava
Yue-Jen CHUU
Richard P. RAVA

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