Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit | Patent Application Number 9402154

9402154
Not Appealed
Patent NumberUS 06622108 B1
Publication Number-
Filled DateSep 29, 1999
Priority DateJan 29, 1999
Inventor/ApplicantsFranciscus G. M. De Jong
Robertus M. W. Raaijmakers
Guillaume E. A. Lousberg
Mathias N. M. Muris
ExaminesMILLER, CRAIG S
Art Unit2857
Technology Center2800
Assignments
Future Link Systems
Current
Koninklijke Philips N.v.
Original
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