Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit | Patent Number 06622108

US 06622108 B1
Application Number9402154
Publication Number-
Pendency3 years, 11 months, 23 days
Filled DateSep 29, 1999
Priority DateJan 29, 1999
Publication Date-
Expiration DateJan 29, 2019
Inventor/ApplicantsMathias N. M. Muris
Guillaume E. A. Lousberg
Franciscus G. M. De Jong
Robertus M. W. Raaijmakers
ExaminesMILLER, CRAIG S
Art Unit2857
Technology Center2800
Assignments
Future Link Systems
Current
Koninklijke Philips N.v.
Original
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