Methods and apparatus for semiconductor testing | Patent Number 06792373

US 06792373 B2
Application Number10154627
Publication NumberUS 20030014205 A1
Pendency2 years, 3 months, 24 days
Filled DateMay 24, 2002
Priority DateMay 24, 2001
Publication DateJan 16, 2003
Expiration DateMay 24, 2021
Inventor/ApplicantsEric Paul Tabor
Eric Paul Tabor
ExaminesBUI, BRYAN
Art Unit2863
Technology Center2800
Assignments
Indepth Test Llc
Current
Test Advantage Inc.
Original
Law Firm
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