Methods and apparatus for semiconductor testing | Patent Publication Number 20030014205

US 20030014205 A1

Patent NumberUS 06792373 B2

Application Number10154627

Filled DateMay 24, 2002

Priority DateMay 24, 2001

Publication DateJan 16, 2003

Original AssigneeTest Advantage Inc.

Current AssigneeIndepth Test Llc

Inventor/ApplicantsEric Paul Tabor
Eric Paul Tabor

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