Methods and devices for independent evaluation of cell integrity, changes and origin in chip design for production workflow | Patent Application Number 12482296

12482296
Not Appealed
Patent NumberUS 08266571 B2
Publication NumberUS 20090307639 A1
Filled DateJun 10, 2009
Priority DateJun 10, 2008
Inventor/ApplicantsDavid Chapman
Thomas Grebinski
ExaminesSIEK, VUTHE
Art Unit2825
Technology Center2800
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