Methods and devices for independent evaluation of cell integrity, changes and origin in chip design for production workflow | Patent Number 08266571
US 08266571 B2Filled DateJun 10, 2009
Priority DateJun 10, 2008
Publication DateDec 10, 2009
Expiration DateJun 9, 2028
Inventor/ApplicantsDavid Chapman
Thomas Grebinski
Thomas Grebinski
ExaminesSIEK, VUTHE
Art Unit2825
Technology Center2800
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