Methods and devices for independent evaluation of cell integrity, changes and origin in chip design for production workflow | Patent Publication Number 20090307639

US 20090307639 A1
Patent NumberUS 08266571 B2
Application Number12482296
Filled DateJun 10, 2009
Priority DateJun 10, 2008
Publication DateDec 10, 2009
Original AssigneeOasis Tooling Inc.
Current AssigneeOasis Tooling Inc.
Inventor/ApplicantsDavid Chapman
Thomas Grebinski
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